测试系统配置介绍(Tester System Configuration)
Company
PartNo
Q'ty
Device type
Digital Channel
Analog Channel
Pattem Deep
Tester frequency
Voltage Scale
Current Scale
VI Source
Current Source
VTT
777
15
Dig+Mem
128
0
16k*1M
10MHz
+/-35V
+/-500mA
8
TRI
TR- 6010
20
Digital
16k*2M
+/-18V
+/-1A
TR- 6800
2
Mix
32
16
20MHz
+/-32V
+/-2A
SYSTEST
Q2- 52
10
Memory
40
4M
+/-20V
YTEC
SCUD 256
1M
+/-45/15
Teradyne
J750
Digtal
512
50MHz
+/-24V
+/-200A
A540
24
25MHz
0-200V
+/-200mA
6
Agilent
HP 93000
14M
100MHz
+/-22V
+/-8A
探针台系统配置介绍(Prober System Configuration)
Part No.
Q'TY
Offline linking
Heading
Contact type
Testing wafer size
3 inch
4 inch
5 inch
6 inch
8 inch
EG
EG2001
Availble
Available
Cable+Mau palter
A
TSK
UF200A
切割设备、挑粒设备、减薄设备系统介绍 (Cutting、 Sorting、 Grinding Machine Syetem Configuration)
Item
Wafer Size Ability
Dicing
DISCO
Cleaning
1
Sorting
KINGBOND
Gringing
Taping
NITTO
De-taping
UV mapping
ARON DENKI
Microscope
GZ
-
Vacuum pack
Oven
ESPEC
3
ESD Detector
SIMCO
ESD Fan
SHIN HAN
机械手、编带机、处观检查机系统配置介绍 (Handler、taping、Machine Lead Scan Machine Configuration)
Contact Type
Final Product Outline
DIP
SOP
HSOP
QFP
PLCC
TSSOP
SSOP
SIP
Handler
MULTITEST
TTSOP
Normal +kevin
SEIMJESS
Normal
SOP/HSOP
TRIPOD
TO/SIP
SEIKO EPSON
NS6000
CHIPRIGHT
3400
Lead Scan
ROOD
LS800
ISMECA
NT16
切封装外形能力介绍(Package and Testing Ability)
类型(Type)
Body Width
8 PIN
14 PIN
16 PIN
18 PIN
20 PIN
22 PIN
24 PIN
28 PIN
30 PIN
32 PIN
44 PIN
48 PIN
54 PIN
64 PIN
128 PIN
300MIL
600MIL
SDIP
150MIL
209MIL
173MIL
10*10MM
分立器件Disceret
类型Type
3 PIN
4 PIN
23
25
26
89
92
220
220FP
252FP
143
343
263
223
TO
SOT
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